• Categories:Company news
• Author:Taizhou Sunano New Energy Office
• Origin:
• Time of issue:2022-10-09 21:23
• Views:

(Summary description)  On September 29, the inaugural meeting of the Nano Detection Sub-Technical Committee of the National Nanotechnology Standardization Technical Committee and the first plenary meeting were successfully held at the Chinese Academy of Metrology (hereinafter referred to as the Chinese Academy of Metrology). The meeting is in a combination of online and offline.   Zhao Yuliang, chairman of the National Nanotechnology Standardization Technical Committee, director of the National Nanoscience Center, academician of the Chinese Academy of Sciences and academician of the Academy of Sciences of Developing Countries, Yang Ping, vice president of the Chinese Academy of Metrology, relevant leaders of the Standard Technology Management Department of the National Standardization Administration Commission, attended the meeting and delivered speeches.   In the middle of the meeting, the leaders of the National Standardization Administration read out the instructions on the establishment of the Nano Detection Technical Sub-Technical Committee of the National Nanotechnology Standardization Technical Committee (hereinafter referred to as the "Nano Detection Sub-Committee"), affirmed the consistent work of the Nano Detection Sub-Committee, and put forward practical requirements and suggestions to the Nano Detection Sub-Committee in combination with the national policy guidance and requirements.   Zhao Yuliang deeply expounded the significance and responsibilities of nanotechnology standardization from the frontier of science and industrial application, and put forward high expectations for the nano-detection subcommeration in combination with the international situation. He pointed out that the China Metrology Institute is the highest metrological scientific research institution in the country. It should give full play to the role of the "national team" and organize the standardization of nano-testing technology nationwide to develop rapidly and steadily towards a higher level. Yang Ping discussed the intrinsic relationship between metrology and standardization, and introduced the achievements of the China Metrology Institute in the field of metrology and standardization over the years. At the same time, on behalf of the Chinese Academy of Metrology, I would like to express my gratitude to the National Standardization Administration Committee and the National Nanotechnology Standardization Technical Committee for their guidance and support in the development and preparation of the Nano Detection Sub-Committee.   In the second half of the meeting, Gao Sitian, chairman of the Nano Detection Subcommittee and researcher of the China Metrology Institute, presided over the first plenary meeting to discuss and improve the statute, working rules, standard system framework and future work plan of the nano-testing subcommittee, and organized exchanges among all members. The vice chairman of the Nano Detection Sub-Committee and Chairman of Juna Group attended the meeting online and delivered a speech.    The first nanotechnology sub-technical committee of the National Nanotechnology Standardization Technical Committee, numbered SAC/TC279/SC2, is mainly responsible for the revision of the national standard system in the field of nanotechnology. The subcommittee is composed of 35 members, Gao Sitian as the chairman, Fang Zheyu and Ding Rong are the vice-chairmen, Huang Lu is the member and secretary-general, and the secretariat is undertaken by the China Metrology Institute.